Modeling OLED luminance decay under thermal, constant and cyclic electrical stress

Organic Light Emitting diodes (OLED), are a lighting technology sensitive to many intrinsic and extrinsic stresses due to its organic character. This paper proposes studying the degradation of warm white, large area OLED panels under accelerated thermal and electrical stress as a tool to estimate their lifespan. The stress recreates the daily turning on and off of lighting under several conditions by applying not only constant, but cyclic electrical current. Luminance decay path will be linearly modelled using a multi-regression with respect to time and stress factors applied, following the design of experiments method. Finally, OLED lifespan at 70% of its initial luminance is predicted, with a 4% average error for OLEDs with a linear decay model.