A System for Simultaneous Application of Uniaxial Strain and Electric Field to the Crystal Sample in Wide Temperature Range for X-Ray Scattering Experiments

The sample cell for the single crystal X-ray diffraction measurements under simultaneous application of the controllable uniaxial tensile strain and electric field in a wide temperature range is described. The details of the cell design are discussed. Test diffraction measurements were performed with 0.67PbMg
1/3
Nb
2/3
O
3
-0.33PbTiO
3
(0.67PMN-0.33PT) single crystal. The sample had platelet shape thinned in central part. Here we present experimental results, acquired with a new system.