Angular Deviation of the Exchange Bias in Bilayer CoFe/IrMn Under Rotating Magnetic Field

A model of exchange bias in a polycrystalline bilayer based on thermal fluctuations was extended to account for an arbitrary magnetization angle of the ferromagnetic (FM) layer. It allows for a more accurate description of the thermally activated reversal of the Néel vector in antiferromagnetic (AFM) grains since the extended model takes into account the variation of barrier height resulting from the magnetization angle of the FM layer. Field-annealing (setting of the exchange bias) and further relaxation of the FM/AFM bilayer was simulated using a sequence of iterations based on this model. An array of AFM grains is generated based on a lognormal distribution of their volume. Chosen parameters of distribution are based on the fit to the experimentally measured temperature dependence of exchange bias in sputter-deposited CoFe/IrMn films. The angular deviation of the exchange bias and the degradation of its amplitude in an applied field, with relative angle varied from 0° to 180°, are calculated. Hysteresis of the exchange bias with field exposure is observed. A temperature–time (
$T$
–
$\tau$
) diagram of the deviation angle, predicting the stability of the exchange bias under specific temperature and time, is presented.