A controller-embedded predictor for preventing unexpected failure in 3D NAND flash

In this work, an unexpected failure phenomenon in 3D NAND flash memory was fist studied. It was found that the raw bit errors of flash memory might suddenly increase during P/E cycling and result in endurance failure. And an effective flash controller-embedded predictor was constructed by FPGA to prevent the unexpected failure in flash memory. Simulation results show that the predictor is able to prevent unexpected failure effectively and improve flash memory lifetime by 1.7 × -7.9x.