SAT-Based Integrated Hardware Trojan Detection and Localization Approach Through Path-Delay Analysis

With the rapid growth in IC outsourcing in the semiconductors industry, concerns have increased about the weakening ICs security against hardware Trojan attacks. In this brief, an integrated hardware Trojan detection and localization methodology is presented by employing the proposed SAT-based test pattern generation scheme and the MUX-based debugging technique. The experimental results show that our methodology can effectively detect timing anomalies in the path-delays caused by hardware Trojans with node coverage around 97% as well as localizing all Trojan's gates with a localization resolution around 99.6%. Moreover, all timing error sites are successfully identified with zero False Negative and 0.56% False Positive rates.