An Optimized Sampling Scheme for Multi-probe Spherical Near-field Measurement

An optimized sampling scheme for more efficient multi-probe spherical near-field measurement is proposed, which is suitable for measurement systems with an electric scanning mode in theta or phi. By properly decreasing the sampling interval that related to mechanical scanning, the proposed sampling scheme is proved efficient for improving measurement efficiency though theoretic analysis of different sampling schemes employing the spherical near-field to far-field transformation algorithm. The validity of the algorithm is also verified through comparing the transformed results with simulated ones.