Performance visualization algorithm of PV module for establishing life time estimation technology

We developed the algorithm for quantifying performance from PV module's I-V characteristics measured in exposure for estimating the lifetime of PV modules. The developed algorithm can accurately detect the PV module's shunt resistance from the I-V characteristic measured in exposure. Further, this algorithm can convert the detected shunt resistance to the current generated by recombination of minority carriers in the PV module. The rate of the recombination current change was compared with the rate of change in luminance of the EL image measured indoors, and a high correlation of 96.7% was obtained.