Design of Verification Standards for S-parameter Measurements from 110 GHz to 170 GHz

This paper describes a new waveguide verification kit has been introduced recently to provide high repeatable and high stable scattering parameter measurements in the frequency range from 110 GHz to 170 GHz. The verification kit consists of three two-port mismatches with flat frequency response, two precision fixed attenuators and a new designed waveguide section. The verification kit can be used as a primary standard for S-parameters. Traceability to the International System of units (SI) is achieved via dimensional measurements of the waveguide aperture or precision calibration by the national attenuation standards. This paper describes the design method of the verification kit, both simulation and measurement results are presented. Furthermore, the uncertainty of measurement results is estimated in this paper.