Tamm Resonances in the Structure 1-D Microwave Photonic Crystal/Conducting Nanometer Layer

The appearance of Tamm resonances in forbidden bands of 1-D microwave photonic crystal with dielectric filling adjacent to monolithic metal nanolayer or to a nanolayer in the form of parallel metal strips has been investigated. The reflection and transmission coefficients in the microwave range were calculated using the transfer matrix method and the finite element method in the ANSYS HFSS software. The experimental data confirmed the calculation results and demonstrated the appearance of Tamm resonances in the X -band at certain thicknesses and electrical conductivities of metal nanolayers. It has been established that the amplitude in the antinodes of the standing electromagnetic wave at the Tamm resonance frequency in the first forbidden band increases monotonically with the distance from the depth of the photonic crystal to its boundary with conducting layer almost linearly. At the frequency of Tamm resonances in the higher-order forbidden bands the amplitude increases stepwise. The method for measuring the electrical conductivity of metal nanolayers contacting the photonic crystal has been theoretically justified and experimentally confirmed. The measurement technique is based on the fitting procedure to minimize by the least squares method the difference between the experimental and calculated frequency dependences of the reflection and transmission coefficients in the vicinity of the Tamm resonance.