First Time Enablement of RF Reliability Simulation Using Cadence Relxpert

In this work, the RF reliability models that are developed using the Energy Driven Hot Carrier model are implemented using Cadence RelExpert and validated at both device level and circuit level. Accurate RF circuit level small signal degradation prediction is showcased for the first time using a cascode based LNA. This can help the designers to estimate the life time of the designs and improve designs up front to meet the design standards through simple simulation.