Contact Device with Tunable Strip Matching Circuits for Measuring Parameters of Microwave Transistors

The design of a contact device for connecting microstrip microwave transistors to a network analyzer with a standard coaxial circuit is discussed. To ensure the coordination of the transistor with the supply path, tunable resistance strip transformers are introduced into the design. The method of measuring the nonlinear S-parameters of the measuring amplifier and the method for determining the parameters of the transistor in real time are considered.