Spatial resolution measurement of near-field probe by using two adjacent microstrip lines

In this paper, an experiment to distinguish the spatial resolution of different magnetic probes is executed. Different from traditional measuring method of spatial resolution by using one microstrip line, we measured the spatial resolution by changing two adjacent microstrip lines with space distances from 3 mm to 0.6 mm. By analyzing the test results, we can distinguish the spatial resolution of different probes.

I. Introduction

With the rapid development of science and technology, the miniaturization of microwave and integrated circuit is an inevitable trend, resulting in small distributed spaces between components of circuits [1]. Meanwhile, due to small space and high operation frequency, electromagnetic interference (EMI) has become more and more obvious, which influences the normal operation of circuit [2]. Noise sources recognition or sources of electromagnetic interference is an effective method for designing circuits. The near field of device-under-test (DUT) measurement can be sensed by using a near field probe to achieve near field surface scanning [3]. Therefore, the probe is an important part of near field scanning.