Quick Development of High Throughput RF Tests on HVM ATE

HVM RF testing are riddle with the problem that a highly efficient fast RF Test library will need lots of maintenance and re-coding. Easy to use RF Library are often not efficient especially in throughput. This paper described the architecture of a fast RF lib that can make HVM RF tests easy to create with almost no need to maintain complex test method. User only need to set test conditions in the tabular frame. Users could be released from hacking codes but always stays on a higher level and keep focusing on the real device testing scheme. It will be significant to help engineers to develop and maintain RF test program [1] quickly and efficiently.