Near Field Scanner for Electromagnetic Pre-Compatibility Tests

In this work the development of a prototype of near field scanner for the realization of electromagnetic precompatibility tests is presented. It allows the capture of magnetic field intensity, both for the analysis of emissions produced by electronic circuits and for the study of nearby field probes. The operation of the scanner consists of moving a probe on the device under test, controlling its positioning through a mechanical and electronic system designed specifically for this prototype. The control and acquisition device is based on the EDU-CIAA development kit of the CIAA project.