A Novel Modeling Approach of Single Event Transients for Particle Strikes

Single event effects (SEEs) have become an important threat against the reliability of integrated circuits (ICs) for the space application. An accurate prediction of soft error susceptibility is the foundation of hardening design of ICs. This requires a precise model to simulate the current induced from the particle strike. The classic double exponential transient current model designed for estimating the susceptibility of ICs is not suitable for nanoscale technology. In this paper, a composite double exponential transient model, which is consists of a prompt collection current and a sustained collection current, is proposed. The model has been validated using Technology Computer Aided Design (TCAD) simulation, which can be applied to evaluate the sensitivity of circuits and validate the effectiveness of hardening technique.