Noise Immunity Improvement in High Voltage Gate Driver IC

In this paper, we proposed a novel noise cancellation circuit that could improve the dv/dt noise immunity and increase the negative voltage surge tolerance significantly. The characteristic of the proposed circuit is to guarantee the reliable operation of high voltage gate driver under high dv/dt noise environment. Based on the high voltage of 600V 1um BCD process model, the simulation results show that the proposed circuit is able to filter out effectively the dv/dt noise up to 85v/ns and increase just 8 ns in propagation delay time. In addition, the negative voltage surge tolerance is -10.8V, and the quiescent current is 36.43 μA at 15V supply voltage.