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Measurement of Leakage Current to Ground in Programmable Josephson Voltage Standards | IEEE Conference Publication | IEEE Xplore

Measurement of Leakage Current to Ground in Programmable Josephson Voltage Standards


Abstract:

The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct ...Show More

Abstract:

The voltage error associated with the leakage current of programmable Josephson voltage standards (PJVS) is one of the largest contributions to the uncertainty in direct comparison of voltage standards. Due to the parallel biasing scheme of the PJVS and the resulting multiple leakage paths, the quantities “leakage resistance” and “leakage current” are not necessarily equivalent. A method to measure and model the leakage current to ground for a given PJVS output voltage is presented. By upgrading simple components of the NIST system, the leakage current to ground can be reduced from 250 pA to 50 pAat 10 V.
Date of Conference: 08-13 July 2018
Date Added to IEEE Xplore: 21 October 2018
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Conference Location: Paris, France
Citations are not available for this document.

I. Introduction

A voltage standard that floats relative to Earth potential offers the flexibility to choose the grounding node of a measurement circuit. This feature is important both for a programmable voltage standard (PJVS) [1] used with Kibble balances [2] and more generally for the measurement of a voltage source that is, by construction, referenced to Earth ground (for example a Zener standard on line-power). The leakage resistance to ground of a PJVS system is not infinite. Because a PJVS array requires a current bias, it is always connected to its bias electronics. The bias electronics have an unavoidable leakage current to ground (LCG) error which must be evaluated and reported as a measurement uncertainty. This effect may constitute the largest contributor to the uncertainty budget of direct PJVS comparisons.

Cites in Papers - |

Cites in Papers - IEEE (4)

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1.
Raegan L. Johnson-Wilke, Jesús M. Mejía, Alain Rüfenacht, Anna E. Fox, Nathan E. Flowers-Jacobs, Paul D. Dresselhaus, Frédéric Overney, Samuel P. Benz, "Impact of Leakage Currents on Voltage Accuracy in the Josephson Arbitrary Waveform Synthesizer", IEEE Transactions on Instrumentation and Measurement, vol.74, pp.1-8, 2025.
2.
R.L. Johnson-Wilke, J. M. Mejia, A. Rüfenacht, A. E. Fox, N. E. Flowers-Jacobs, P. D. Dresselhaus, S. P. Benz, "Leakage Current Pathways in Josephson Arbitrary Waveform Synthesizer Standards", 2024 Conference on Precision Electromagnetic Measurements (CPEM), pp.1-2, 2024.
3.
S. Yang, S. Cular, A. Rüfenacht, C. J. Burroughs, P. D. Dresselhaus, S. P. Benz, M. N. Ng, "Direct DC Voltages Comparison between two Programmable Josephson Voltage Standards at SCL", 2020 Conference on Precision Electromagnetic Measurements (CPEM), pp.1-2, 2020.
4.
Charles J. Burroughs, Alain Rüfenacht, Stefan Cular, Paul D. Dresselhaus, "Automated Leakage Current Measurement Capability for Programmable Josephson Voltage Standards", 2020 Conference on Precision Electromagnetic Measurements (CPEM), pp.1-2, 2020.

Cites in Papers - Other Publishers (1)

1.
J. Nissilä, T. Fordell, K. Kohopää, E. Mykkänen, P. Immonen, R. N. Jabdaraghi, E. Bardalen, O. Kieler, B. Karlsen, P. A. Øhlckers, R. Behr, A. J. Manninen, J. Govenius, A. Kemppinen, "Driving a low critical current Josephson junction array with a mode-locked laser", Applied Physics Letters, vol.119, no.3, pp.032601, 2021.
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