Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging

The contrast sensitivity and dynamic range of Cd/sub 1-x/Zn/sub x/Te semiconductor detectors have been measured within the X-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state-ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd/sub 1-x/Zn/sub x/Te detectors have excellent contrast sensitivity response and large dynamic range.