Static analysis of microstrip discontinuities using the excess charge density in the spectral domain

Galerkin's method in the spectral domain is applied to solve for the excess charge density existing on the strips of open-end and symmetric gap discontinuities in multilayered anisotropic substrates. The excess charge density is used to determine the capacitance components of the equivalent circuits, of these discontinuities. Numerical results are provided and a comparison with previous results is carried out.<
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