Microwave resonance detection of high-energy radiation defects in VLSI for space applications

A method of microwave resonance detection was attempted on radiation defects generated by cosmic rays that caused soft errors in VLSI operation for space application. Under /spl gamma/-ray irradiation of 10/sup 6/ rad, new signals were observed. The intensities of the observed signals correlate with soft error rates. The origin of new centers, however, remains some ambiguities owing to low signal to noise ratios to determine definite structures.