Photoluminescence Imaging Using Silicon Line-Scanning Cameras

We experimentally demonstrate photoluminescence imaging using a silicon line-scanning camera. The narrow rectangular geometry of the sensor effectively lowers the image-blur, while keeping the sensitivity relatively high. Line scanning is demonstrated to provide sharp and high contrast images. To maintain fast measurement speeds, higher injections are used to compensate for the lower sensitivity of a line-scan measurement, where localized parts of the image are acquired sequentially. However, low-injection measurements remain possible at the expense of slower scan speeds if cooling is applied to the sensor. Using a detailed point-spread analysis and deconvolution, we quantify and correct for the remaining light spreading effects. Experimental results suggest an effective suppression of the cumulative nonlocal point spread commonly observed using area sensors, confirming silicon (Si) line sensors to be only susceptible to local point spreading effects.