Different Shear Height Stress Evaluation on -0.7Cu Based Lead Free Solder

Interconnection technology has improved by leaps and bounds since the advent of solder reflow. This has made surface mount technology more robust. Ball Grid Array (BGA) is a demanding surface mount chip package in Integrated Circuits (IC) which uses a grid of solder balls as its connectors. In this preliminary study, load effects of shear test on a single solder joint with varied parameters are briefly discussed. A suitable lead-free solder is used in this study which is Sn-3.5Ag-0.7Cu. Simple Single Factor (SSF) method was used to execute this experimental study. Ansys software was used to simulate and investigate the stress response on a single solder ball joints. The results shows that when the shear height is high the shear stress is reduced.