Black-box modelling of conducted electromagnetic immunity by support vector machines

A concept of modelling electromagnetic immunity (EMI) of integrated circuits (IC) by using support vector machines (SVM) is presented. The problem of detecting, modelling and predicting failure of the integrated circuit operation due to the conducted electromagnetic interferences according to IEC 62132-4 standard is transformed into the classification problem solved by SVM. As a electronic circuit test case, the conducted EMI model of local interconnect network (LIN) interface circuit is presented.