Inverse analysis for magnetic field source searching in thin film conductor

Previously, we have proposed the sampled pattern matching (SPM) method solving for the inverse problem. In the present paper, we propose a generalized SPM method. The generalized SPM method makes it possible to estimate both the direction and magnitude of currents. We apply this new method to the current estimation in a thin film conductor. Numerical simulation suggests the validity of the method. As a result, this paper presents an effective methodology to estimate a current distribution in a thin film conductor.