The study on real-time data processing based on CCD scanning and detecting device on FPGA

To solve the crossing-linkable polyethylene (XLPE) insulation compound purity evaluation problem, a high speed scanning measurement system was designed according to FPGA. With the updated information technology and advanced electronic devices, it is possible to develop a new inspecting technology for sorting, checking and evaluating material quality, by which defects microscopic images can be real-time recorded, processed and displayed. The experimental results demonstrated that defects within 70 ¿m~1000 ¿m were inspected effectively by the CCD scanning defects inspection instrument, and Good agreement was shown between defects images real-time reconstructed and optical microscopic images not only in shape but also in gray.