I. Introduction
Linear feedback shift register (LFSR) is widely used in pseudorandom generator. Chien described an optimized BIST scheme which has a configurable 2-D LFSR structure and presented a synthesis procedure for this test generator. Experimental results show that the hardware overhead is considerably reduced compared with 2-D LFSR generators [1]. Erik H. presents a new test response compaction technique with any Number of Unknowns using a new LFSR Architecture in the test response bits [2].