Characterization of neutron radiation damage in GaAs

The NJOY and MARLOWE computer codes are used to characterize neutron damage to GaAs. The fidelity of the components that affect the calculated GaAs damage is examined. The initial defect production is found to be a linear function of the damage energy. Recombination of Frenkel pairs and the distribution of vacancies introduce a nonlinearity in the residual defect population with respect to the damage energy. Consideration of the defect recombinations only provides a slight improvement in the agreement between measured and calculated damage in GaAs but does indicate the areas where more work is needed.<
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