Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation

We report here the development of a unique and comprehensive computer program (SEMM) to calculate the probability of soft fails in integrated circuits due to alpha particles emanating from the chip materials and due to terrestrial cosmic rays. This model treats all failure modes on an event by event basis allowing for all nuclear reactions and pulse shape effects. It is a three-dimensional design tool that takes the detailed chip layout and profile information to compute the soft error rate and is used without any parameter fitting. SEMM has been extensively tested with hot sources, high energy proton beams, and high elevation cosmic ray tests. Applications of SEMM to bipolar and CMOS chips and considerations for building in reliability for radiation induced soft fails are also discussed.<
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