Magnetic and recording characteristics of Co-Cr-Ta/Cr thin film prepared on Si substrate

Co/sub 85/Cr/sub 15-x/Ta/sub x/ (x:0,2)/Cr films with microscopic flat surfaces were investigated for high-density recording media. These films were deposited on silicon disk substrates at the substrate temperature T/sub s/ of 350 degrees C at argon pressure as low as sub-mTorr by using facing targets sputtering (FTS) apparatus. The elevating of T/sub s/ promoted the in-plane c-axis orientation of Co crystallites. The media noise due to zigzag domain was found to be reduced by using a Cr underlayer as thick as 2500 AA at T/sub s/ of 350 degrees C. Media noise due to the non-uniform state of magnetization in the writing process can be reduced by using a smooth underlayer, suggesting that smooth film is preferable for high density recording.<
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