Scan and Automated Test Pattern Generation in VLSI

Integrated circuits (ICs) are becoming more and more complicated, which makes it difficult to guarantee their functioning and dependability. Automated testing techniques are crucial for identifying and resolving this issue by identifying and diagnosing IC problems. Among these approaches, test pattern generation and scan-based testing are essential for quickly locating and analyzing flaws. The creation of an automated system for test pattern generation and scan-based testing in the context of ICs is the main goal of this study. The suggested solution makes use of cutting-edge algorithms and methodologies to improve the efficacy and efficiency of the testing procedure. The system’s initial component entails incorporating scan chains into the IC design. Scan chains offer observable and adjustable places in the circuit, making it possible to apply test patterns and track responses. This integration makes it possible to isolate and analyze particular IC portions, which enables thorough testing. The system’s second part deals with the automatic creation of test patterns. Given the complexity of current ICs, traditional approaches for generating test patterns may be both time-consuming and not the best. The suggested method creates test patterns intelligently by utilizing sophisticated algorithms, including machine learning and artificial intelligence. These algorithms create effective and high-coverage test patterns by examining the circuit’s architecture, functioning, and past test data. Moreover, the system integrates self-learning techniques to adjust to changing fault models and integrated circuit designs. Because of its flexibility, testing can continue to be efficient even with increasingly complex IC architectures. The suggested system’s efficacy in terms of fault coverage, test time reduction, and adaptation to different IC designs is demonstrated by the experimental evaluation. The outcomes show a notable improvement over conventional testing methods, underscoring the automated scan and test pattern generation system’s potential to raise the effectiveness and dependability of IC testing.