Recent high power microwave driver studies in NUDT

In the dynamic landscape of high power microwave (HPM) research, NUDT actively engaged in studies across different distinct technologies of HPM tubes [1] and drivers. For the drivers, we mainly focus on three kinds of generators: those utilizing liquid pulse forming lines (PFL), those utilizing pulse forming networks (PFN) and Marx generators, and those employing solid-state switches. These technologies collectively represent a comprehensive exploration into diverse approaches for advancing HPM drivers. First, the liquid pulse forming line-based generators leverage the unique properties of liquid mediums with high permittivity to achieve high energy density, high efficient energy transfer and high quality pulse shaping, which are essential for optimal long pulse HPM generation [2]. Typical parameters of such generators are: peak power up to 20 GW, pulse width up to 200 ns, rep-rate up to 20 Hz and matched impedance between 10-50 Ohms. Second, we research on PFN and Marx generators, which combines the pulse energy storage and pulse forming and makes more compact generators, ensuring a robust and adaptable HPM driver platform [3]. Typical parameters are: weight less than 100 kg, peak power up to 10 GW, pulse width around 100 ns, rep-rate up to 10 Hz and matched impedance between 50-100 Ohm. Third, we explore the development of generators utilizing solid-state switches, including the magnetic switches and high power semiconductor switches, which aims at a kind of more reliable, long lifetime, and rapidly-switching components, aligning with the modern trend towards miniaturization and increased operational flexibility [5]. We wish to extend the lifetime of such generators to above $10^{\wedge} 6$, since there are no electrode erosion problems found in other generators. Through the multifaceted technological pursuits, NUDT continues to contribute to the evolving field of high power microwave drivers, which have applications in fields ranging from defense to communication and beyond.