Planar Resonant Sensors for the Characterization of Low Dielectric Materials

This paper introduces a non-invasive planar sensor designed for characterizing low dielectric materials. The sensor employs two staggered S-shaped structures distributed on a metallic ground plane, allowing for dielectric characterization by etching the structures through the ground plane and coupling them to a microstrip transmission line above a dielectric substrate. Electromagnetic simulation is employed to analyze how the relative permittivity, relative permeability, and tangent variation of the dielectric loss angle of the material under test impact the resonant frequency of the sensor. Both experimental and simulation results demonstrate that the sensor possesses a simple structure, robustness, and significant potential for applications in biological, medical, and food detection.