Multi-ports 2X-Thru De-Embedding with Time Domain Gating Method

In high-speed PCB process, the trace impedance error is generally controlled to 10%, which brings accuracy problems for the traditional 2X-Thru de-embedding algorithm. In this paper, a multi-ports 2X-Thru de-embedding method based on time-domain gating technology is proposed to characterize the transmission line segment of the fixture, and the peeling algorithm is used to realize the multi-ports 2X-Thru de-embedding, which has good robustness to manufacturing errors of the fixture.