Electronic Total Ionizing Dose Test Calibration Method and Analysis of Radiation Damage Mechanism

Astronautic integrated circuits face total ionizing dose effects in near-Earth orbit space, the main source is the radiation effect produced by space particles such as electrons in the Van Allen radiation belt. The current industry standard ground-based total ionizing dose simulation tests are mainly conducted on Co60 radiation sources. However, electrons differ from photons in the total dose radiation damage mechanism and damage effect. In this paper, by conducting total ionizing dose of electron test and data analysis, and construct an alanine-based electron absorption dose model by software, summarizing electron radiation damage mechanism and law, obtaining relative dose absorption ratio coefficients under different energy electron irradiation, and proposing considerations for the test of total ionizing dose of electron.