Dynamic Hysteresis and Loss Prediction of GO Silicon Steel Under High-Frequency Excitation with DC-Bias

A dynamic hysteresis model is proposed for the loss prediction of grain-oriented (GO) silicon steel under high-frequency DC-biased excitation. When the GO silicon steel is driven by high-frequency excitations, the skin effect should be taken into consideration. The proposed dynamic hysteresis model takes into account the skin effect of the GO silicon steel along with the high-frequency DC-biased magnetization under the unsaturated condition and the saturated condition respectively. Then, the loss of the GO silicon steel is estimated by the proposed dynamic hysteresis model. Compared to the measurement results, the accuracy and effectiveness of the model are validated.