A System Reliability Demonstration Test Design Method Based on Subsystem Test Data

Reliability Demonstration Test (RDT) is the test to verify that the reliability of the product meets the reliability requirements during the product development and is usually required to be performed to determine whether it can be accepted. It is essential for the complex systems with higher costs. However, the test plans provided in the current RDT standard GJB-899A has the problem of too long test time or too high risk. In addition, the test data of the complex system itself is usually less, but the test data of the subsystem is easier to obtain. In this paper, we choose the system as the research object, and considers how to use the reliability growth data in the development stage of the subsystem to design the system RDT. Firstly, based on the reliability growth model, the test data in the development stage of the subsystems are modeled to obtain the reliability of each subsystem. Then obtain the reliability of the system based on the system structure, and use Bayes theory to obtain the life distribution of the system. Finally, according to the definition of the two types of risks in the RDT, the life distribution of the product is integrated into the two types of risks, and the requirements are developed, and the RDT plans of the system is designed. And use a simulation case to verify the RDT design method designed in the end of this paper.