Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability

Computing-in memories (CIMs) support memory and computing functions. The operations of computing function are much different from the read/write operations of conventional memories, e.g., multiple wordlines are activated, specific sensing methods, and so on. Those cause that the CIM has computing faults. Conventional march tests for memories cannot cover the computing faults and new test algorithms are needed. In this embedded tutorial, therefore, we introduce fault modeling and test development methods for CIMs with logic operations. Furthermore, we will provide perspectives on the design-for-testability techniques for CIMs as well.