Parametric and Catastrophic Failures of Metallized Film Capacitors Under High Voltage Stress

Operation ability of different metallized film capacitors under high voltage stress was investigated. The automated ramp voltage test method was suggested. The experimental setup and software for experimental data processing were developed. Self-healing characteristics in the wide temperature range were obtained. It was found that increasing of operating temperature leads to decreasing of self-healing events number which corresponds to parametric or catastrophic failure. The critical values of cumulative self-healing energy for investigated capacitors until parametric and catastrophic failures were determined. Statistical analysis of self-healing events showed the presence of two types of processes with different energy distributions.