Pulsed Sub-THz Wideband Vector Component Analysis

Pulsed Sub-THz active component testing is enabled for wideband repetitive test signals within a VNA instrument. A coherent stroboscopic approach on top of a timestamp phase stitching technique allows access to the measured amplitudes and phases of the test signal tones for
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arbitrary modulation bandwidth at sub-THz carrier frequency. Time domain IQ data is then available at DUT ports and used to perform demodulation.