Dynamic Analysis by Laser Stimulation (DALS) Applied on Analog and mixed-signal IC

The present study utilized the Dynamic Analysis by Laser Stimulation (DALS) technique to investigate the electrical behavior of Analog and Mixed Signal (AMS) devices. The utilization of DALS for the purpose of soft defect localization, a methodology specifically tailored to the identification of faults that are only manifested under specific conditions such as temperature, frequency, and voltage, was found to be a viable approach. The results obtained through the application of DALS were found to be in alignment with the expected outcomes, indicating that the technique was able to accurately pinpoint the location of the failure site and component, in comparison to the more commonly utilized traditional fault localization techniques.