Locating EMI Sources in Shielding Enclosures Using a Two-Step Source Reconstruction Method

Locating the sources of electromagnetic interference (EMI) in shielding enclosures is a complex task due to the intricate electromagnetic environment. In this study, we propose a two-step source reconstruction method (SRM) as a solution to this issue. The EMI sources are initially modeled as equally distributed equivalent electric dipoles inside the enclosure, taking into account the effects of the surrounding environment through the use of numerical Green's functions. These initial equivalent sources are subsequently downsized by evaluating the contribution of each dipole, leading to the update of the parameters of the remaining dipoles through a further source reconstruction process that includes the incorporation of additional equivalent magnetic dipoles for enhanced precision. Our method allows for the clear identification of the locations and geometries of EMI sources in the enclosure and accurate estimation of their radiated emissions. The effectiveness of the SRM is demonstrated through representative numerical examples.