Absorption Markov Lifetime Evaluation Model Based on Weibull Distribution

Lifetime test is an important part of integrated circuit reliability research. The lifetime of samples can be theoretically evaluated through lifetime test. However, the current lifetime evaluation is mostly carried out through a large amount of empirical and historical data accumulation, which requires a mass of time and economic cost. In this paper, the lifetime of the sample can be theoretically deduced from a small amount of data by absorption Markov chain based on Weibull distribution.