Analytical and Measurement-Based Method for Voltage Fault Injection of CAN Chip Security

The need for CAN chip dependability is growing urgent due to the widespread use of CAN bus in numerous sectors and professions. This word presents an analytical method of voltage fault injection measurement-based CAN chip security. The automatic hardware FI test method based on the prototype system is proposed to detect the fault error in abnormal environment. The signal trigger and control module is designed to test automation process. In addition, the extended parameter model is established for shortening test time and automatic statistical analysis of a number of test data. The results show that the test circuit system CAN realize the voltage random fault test and automatic analysis in the range of $1.5 \sim 5.5\mathrm{V}$, which provides a more accurate and comprehensive basis for improving the security of CAN chip.