An analytical approach for quick, efficient design of thin film optical systems

This paper proposes an analytical approach for simulating thin film optical material systems. This method ensures a fast and efficient study of optical properties which otherwise require experimentation. The effectiveness of the method is demonstrated through an example of a thin film of vanadium dioxide, showcasing its ability to accurately model the behaviour of the film for varying thicknesses. Overall, the presented method has the potential to greatly enhance the design capabilities of researchers studying optical systems.