Stability of Dielectric Properties of LTCC After Ionizing Irradiation

This article describes experiments on the measurement of dielectric properties and stability of low-temperature cofired ceramics (LTCC) material after exposure to ionizing radiation, such as electron stream and gamma ray. The exposure of ceramic structures was carried out by means of electron linear accelerator “Lillyput 3” at various total doses of irradiation corresponding to equivalent ionizing radiation on low earth orbit (LEO) in specified lifetime. The aim of the experiment was to verify stability of the LTCC material for application in devices operating in LEO. Tests were performed on flat capacitor samples with partially exposed dielectric layer at one of the capacitor’s electrode made as a meshed structure. Results of electrical measurements, both low voltage ac analysis using an impedance analyzer as well as dc leakage at high voltage, have not revealed any deterioration of dielectric properties of the ceramics after exposure at selected irradiation doses. Experiments confirmed the LTCC material is suitable for the fabrication of the components for the gas electron multiplier (GEM) device operating in LEO.