Measurement of Electromagnetic Property of Dielectric Material Based on Transmission/Reflection Method

An improved transmission/reflection method for mm wave band is proposed in this paper. The derivation of the traditional transmission/reflection method is shown firstly. Then, the thickness resonance problem of the traditional transmission/reflection method in mm wave band is solved. The last, the improved method was used to measure the Ka band electromagnetic parameters of several materials. The experimental results were achieved, which verified the improved method in mm wave band. In the next, this method will be extended to W band.