Noise Analysis in FinFET-based Analog Circuit with Technology Scaling

Noise in any circuit determines the minimum acceptable signal level that can process without compromising its functionality. In field-effect transistors (FETs), mainly two types of noise occur, i.e., flicker (1/1) and thermal noise, which requires proper attention for designing the analog circuits. This paper analyzes the noise behavior in FinFET-based cascode differential amplifier (CDA) for different technological nodes. Using well-calibrated PTM models in HSPICE, we investigated: (i) the Noise behavior in 22nm node FinFET and planarMOSFET; (ii) the impact of FinFET technology nodes (i.e., 16nm, 14nm, 10nm) over noise spectral density; (iii) trend of the corner frequency ($f_{\mathrm{c}}$) demarcating the flicker and thermal noise in scaled FinFET; (iv) impact of varying the number of fins on the noise behavior. The understanding of Noise in FinFET is thus worth exploring to design reliable FinFET-based analog circuits.