Novel SCR Device for ESD Protection with High-Holding Voltage in 0.18um BCD Process

This paper proposes a novel SCR-based ESD protection device that exhibits a high holding voltage with high performance, developed for Power Management Integrated Circuit(PMIC) ESD protections based on
$0.18-\mu \mathrm{m}$
HV Bipolar-CMOS-DMOS(BCD) technology platform. By converting a structure of the SCR from the conventional one, experimental results demonstrate that the proposed SCR device achieves a suitable design window and also has latchup-immunity and ESD robustness for using HV power device process.