On-chip canary circuit design for electronic interconnects by utilizing RF resonance peak movement as a prognostic factor

This paper presents that S-parameter patterns can capture initiation and propagation of the cracks in electrical interconnects. Especially, resonance peak movement in the radio frequency (RF) region can be an effective prognostic factor. Furthermore, we designed and simulated an on-chip canary circuit utilizing this factor, which can monitor health of the interconnects.