Loading [MathJax]/extensions/MathMenu.js

Jisoo Hwang - IEEE Xplore Author Profile

Scheduled Maintenance on Monday 1/13/2025

Single article sales and account management will be unavailable from 5:00 AM - 7:00 PM ET (09:00 - 23:00 UTC). We apologize for the inconvenience.

IEEE.org
IEEE Xplore
IEEE SA
IEEE Spectrum
More Sites

- Donate
- Personal Sign In

Access provided by:

MIT Libraries

Access provided by:

MIT Libraries

ADVANCED SEARCH

Author details

Jisoo Hwang

Also published under: J. S. Hwang, JiSoo Hwang

Publications

26

Citations

91

Publications by Year

20052024

Co-Authors:

Taekeun AnY. S. ChoM. H. ChoYoungsang ChoJu Yeon Choi

Show All Co-Authors (71)

Jisoo Hwang

Also published under: J. S. Hwang, JiSoo Hwang

Affiliation

S.LSI Business

Samsung Electronics Co. Ltd.

Hwaseong-si, Korea

Publication Topics

System-on-chip,
Voltage Drop,
Ceramic Capacitors,
Design Software,
Impedance,
Equivalent Series Resistance,
Fabrication Process,
Frequency Domain,
Metal Layer,
Organic Substances,
Power Delivery Network,
Power Integrator

Biography

Jisoo Hwang received the B.S. and M.S. degrees from the Department of Semiconductor Systems Engineering, Sungkyunkwan University, Suwon, South Korea, in 2013 and 2015, respectively.,He is currently with the Package Developement Team, Semiconductor Research and Development Center, Samsung Electronics, Hwaseong, South Korea. His current research interests include signal and power integrity, and electromagnetic interference in electronic systems.(Based on document published on 25 January 2018).

Publications

26

Citations

91

Publications by Year

20052024

Co-Authors:

Taekeun An
Y. S. Cho
M. H. Cho
Youngsang Cho
Ju Yeon Choi

Show All Co-Authors (71)

Author's Published Works

Search History

Showing 1-4 of 4 results

Conferences (4)

Sort

Filter Results

Show

Subscribed Content

Open Access Only

Range
Single Year
Zhiwei Xiong(4)
Jie Huang(4)
Zeyu Xiao(3)
Radu Timofte(3)
Ruikang Xu(3)
Seoul National University(2)
University of Science and Technology of China(1)
NTIRE 2020 challenge organizers(1)
2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)(2)
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)(1)
2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)(1)
IEEE(4)
Nashville, TN, USA(2)
New Orleans, LA, USA(1)
Seattle, WA, USA(1)
Convolutional Layers(4)
Residual Block(4)
Blurry Images(3)
Channel Attention(3)
Deformable Convolution(3)

Select All on Page

Sort By

Results

NTIRE 2022 Burst Super-Resolution Challenge

Goutam Bhat;Martin Danelljan;Radu Timofte;Yizhen Cao;Yuntian Cao;Meiya Chen;Xihao Chen;Shen Cheng;Akshay Dudhane;Haoqiang Fan;Ruipeng Gang;Jian Gao;Yan Gu;Jie Huang;Liufeng Huang;Youngsu Jo;Sukju Kang;Salman Khan;Fahad Shahbaz Khan;Yuki Kondo;Chenghua Li;Fangya Li;Jinjing Li;Youwei Li;Zechao Li;Chenming Liu;Shuaicheng Liu;Zikun Liu;Zhuoming Liu;Ziwei Luo;Zhengxiong Luo;Nancy Mehta;Subrahmanyam Murala;Yoonchan Nam;Chihiro Nakatani;Pavel Ostyakov;Jinshan Pan;Ge Song;Jian Sun;Long Sun;Jinhui Tang;Norimichi Ukita;Zhihong Wen;Qi Wu;Xiaohe Wu;Zeyu Xiao;Zhiwei Xiong;Rongjian Xu;Ruikang Xu;Youliang Yan;Jialin Yang;Wentao Yang;Zhongbao Yang;Fuma Yasue;Mingde Yao;Lei Yu;Cong Zhang;Syed Waqas Zamir;Jianxing Zhang;Shuohao Zhang;Zhilu Zhang;Qian Zheng;Gaofeng Zhou;Magauiya Zhussip;Xueyi Zou;Wangmeng Zuo

2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2022 | Conference Paper |

Cited by: Papers (19)

HTML

Burst super-resolution has received increased attention in recent years due to its applications in mobile photography. By merging information from multiple shifted images of a scene, burst super-resolution aims to recover details which otherwise cannot be obtained using a simple input image. This paper reviews the NTIRE 2022 challenge on burst super-resolution. In the challenge, the participants w...Show More

NTIRE 2022 Burst Super-Resolution Challenge

Goutam Bhat;Martin Danelljan;Radu Timofte;Yizhen Cao;Yuntian Cao;Meiya Chen;Xihao Chen;Shen Cheng;Akshay Dudhane;Haoqiang Fan;Ruipeng Gang;Jian Gao;Yan Gu;Jie Huang;Liufeng Huang;Youngsu Jo;Sukju Kang;Salman Khan;Fahad Shahbaz Khan;Yuki Kondo;Chenghua Li;Fangya Li;Jinjing Li;Youwei Li;Zechao Li;Chenming Liu;Shuaicheng Liu;Zikun Liu;Zhuoming Liu;Ziwei Luo;Zhengxiong Luo;Nancy Mehta;Subrahmanyam Murala;Yoonchan Nam;Chihiro Nakatani;Pavel Ostyakov;Jinshan Pan;Ge Song;Jian Sun;Long Sun;Jinhui Tang;Norimichi Ukita;Zhihong Wen;Qi Wu;Xiaohe Wu;Zeyu Xiao;Zhiwei Xiong;Rongjian Xu;Ruikang Xu;Youliang Yan;Jialin Yang;Wentao Yang;Zhongbao Yang;Fuma Yasue;Mingde Yao;Lei Yu;Cong Zhang;Syed Waqas Zamir;Jianxing Zhang;Shuohao Zhang;Zhilu Zhang;Qian Zheng;Gaofeng Zhou;Magauiya Zhussip;Xueyi Zou;Wangmeng Zuo

2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2022 | Conference Paper |

EDPN: Enhanced Deep Pyramid Network for Blurry Image Restoration

Ruikang Xu;Zeyu Xiao;Jie Huang;Yueyi Zhang;Zhiwei Xiong

2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2021 | Conference Paper |

Cited by: Papers (22)

HTML

Image deblurring has seen a great improvement with the development of deep neural networks. In practice, how-ever, blurry images often suffer from additional degradations such as downscaling and compression. To address these challenges, we propose an Enhanced Deep Pyramid Network (EDPN) for blurry image restoration from multiple degradations, by fully exploiting the self- and cross-scale similarit...Show More

EDPN: Enhanced Deep Pyramid Network for Blurry Image Restoration

Ruikang Xu;Zeyu Xiao;Jie Huang;Yueyi Zhang;Zhiwei Xiong

2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2021 | Conference Paper |

NTIRE 2021 Challenge on Image Deblurring

Seungjun Nah;Sanghyun Son;Suyoung Lee;Radu Timofte;Kyoung Mu Lee;Liangyu Chen;Jie Zhang;Xin Lu;Xiaojie Chu;Chengpeng Chen;Zhiwei Xiong;Ruikang Xu;Zeyu Xiao;Jie Huang;Yueyi Zhang;Si Xi;Jia Wei;Haoran Bai;Songsheng Cheng;Hao Wei;Long Sun;Jinhui Tang;Jinshan Pan;Donghyeon Lee;Chulhee Lee;Taesung Kim;Xiaobing Wang;Dafeng Zhang;Zhihong Pan;Tianwei Lin;Wenhao Wu;Dongliang He;Baopu Li;Boyun Li;Teng Xi;Gang Zhang;Jingtuo Liu;Junyu Han;Errui Ding;Guangpin Tao;Wenqing Chu;Yun Cao;Donghao Luo;Ying Tai;Tong Lu;Chengjie Wang;Jilin Li;Feiyue Huang;Hanting Chen;Shuaijun Chen;Tianyu Guo;Yunhe Wang;Syed Waqas Zamir;Aditya Arora;Salman Khan;Munawar Hayat;Fahad Shahbaz Khan;Ling Shao;Yushen Zuo;Yimin Ou;Yuanjun Chai;Lei Shi;Shuai Liu;Lei Lei;Chaoyu Feng;Kai Zeng;Yuying Yao;Xinran Liu;Zhizhou Zhang;Huacheng Huang;Yunchen Zhang;Mingchao Jiang;Wenbin Zou;Si Miao;Yangwoo Kim;Yuejin Sun;Senyou Deng;Wenqi Ren;Xiaochun Cao;Tao Wang;Maitreya Suin;A. N. Rajagopalan;Vinh Van Duong;Thuc Huu Nguyen;Jonghoon Yim;Byeungwoo Jeon;Ru Li;Junwei Xie;Jong-Wook Han;Jun-Ho Choi;Jun-Hyuk Kim;Jong-Seok Lee;Jiaxin Zhang;Fan Peng;David Svitov;Dmitry Pakulich;Jaeyeob Kim;Jechang Jeong

2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2021 | Conference Paper |

Cited by: Papers (35)

HTML

Motion blur is a common photography artifact in dynamic environments that typically comes jointly with the other types of degradation. This paper reviews the NTIRE 2021 Challenge on Image Deblurring. In this challenge report, we describe the challenge specifics and the evaluation results from the 2 competition tracks with the proposed solutions. While both the tracks aim to recover a high-quality ...Show More

NTIRE 2021 Challenge on Image Deblurring

Seungjun Nah;Sanghyun Son;Suyoung Lee;Radu Timofte;Kyoung Mu Lee;Liangyu Chen;Jie Zhang;Xin Lu;Xiaojie Chu;Chengpeng Chen;Zhiwei Xiong;Ruikang Xu;Zeyu Xiao;Jie Huang;Yueyi Zhang;Si Xi;Jia Wei;Haoran Bai;Songsheng Cheng;Hao Wei;Long Sun;Jinhui Tang;Jinshan Pan;Donghyeon Lee;Chulhee Lee;Taesung Kim;Xiaobing Wang;Dafeng Zhang;Zhihong Pan;Tianwei Lin;Wenhao Wu;Dongliang He;Baopu Li;Boyun Li;Teng Xi;Gang Zhang;Jingtuo Liu;Junyu Han;Errui Ding;Guangpin Tao;Wenqing Chu;Yun Cao;Donghao Luo;Ying Tai;Tong Lu;Chengjie Wang;Jilin Li;Feiyue Huang;Hanting Chen;Shuaijun Chen;Tianyu Guo;Yunhe Wang;Syed Waqas Zamir;Aditya Arora;Salman Khan;Munawar Hayat;Fahad Shahbaz Khan;Ling Shao;Yushen Zuo;Yimin Ou;Yuanjun Chai;Lei Shi;Shuai Liu;Lei Lei;Chaoyu Feng;Kai Zeng;Yuying Yao;Xinran Liu;Zhizhou Zhang;Huacheng Huang;Yunchen Zhang;Mingchao Jiang;Wenbin Zou;Si Miao;Yangwoo Kim;Yuejin Sun;Senyou Deng;Wenqi Ren;Xiaochun Cao;Tao Wang;Maitreya Suin;A. N. Rajagopalan;Vinh Van Duong;Thuc Huu Nguyen;Jonghoon Yim;Byeungwoo Jeon;Ru Li;Junwei Xie;Jong-Wook Han;Jun-Ho Choi;Jun-Hyuk Kim;Jong-Seok Lee;Jiaxin Zhang;Fan Peng;David Svitov;Dmitry Pakulich;Jaeyeob Kim;Jechang Jeong

2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2021 | Conference Paper |

NTIRE 2020 Challenge on Image and Video Deblurring

Seungjun Nah;Sanghyun Son;Radu Timofte;Kyoung Mu Lee;Yu Tseng;Yu-Syuan Xu;Cheng-Ming Chiang;Yi-Min Tsai;Stephan Brehm;Sebastian Scherer;Dejia Xu;Yihao Chu;Qingyan Sun;Jiaqin Jiang;Lunhao Duan;Jian Yao;Kuldeep Purpohit;Maitreya Suin;A.N. Rajagopalan;Yuichi Ito;P.S. Hrishikesh;Densen Puthussery;K.A. Akhil;C.V. Jiji;Guisik Kim;P.L. Deepa;Zhiwei Xiong;Jie Huang;Dong Liu;Sangmin Kim;Hyungjoon Nam;Jisu Kim;Jechang Jeong;Shihua Huang;Yuchen Fan;Jiahui Yu;Haichao Yu;Thomas S. Huang;Ya Zhou;Xin Li;Sen Liu;Zhibo Chen;Saikat Dutta;Sourya Dipta Das;Shivam Garg;Daniel Sprague;Bhrij Patel;Thomas Huck

2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2020 | Conference Paper |

Cited by: Papers (24)

HTML

Motion blur is one of the most common degradation artifacts in dynamic scene photography. This paper reviews the NTIRE 2020 Challenge on Image and Video Deblurring. In this challenge, we present the evaluation results from 3 competition tracks as well as the proposed solutions. Track 1 aims to develop single-image deblurring methods focusing on restoration quality. On Track 2, the image deblurring...Show More

NTIRE 2020 Challenge on Image and Video Deblurring

Seungjun Nah;Sanghyun Son;Radu Timofte;Kyoung Mu Lee;Yu Tseng;Yu-Syuan Xu;Cheng-Ming Chiang;Yi-Min Tsai;Stephan Brehm;Sebastian Scherer;Dejia Xu;Yihao Chu;Qingyan Sun;Jiaqin Jiang;Lunhao Duan;Jian Yao;Kuldeep Purpohit;Maitreya Suin;A.N. Rajagopalan;Yuichi Ito;P.S. Hrishikesh;Densen Puthussery;K.A. Akhil;C.V. Jiji;Guisik Kim;P.L. Deepa;Zhiwei Xiong;Jie Huang;Dong Liu;Sangmin Kim;Hyungjoon Nam;Jisu Kim;Jechang Jeong;Shihua Huang;Yuchen Fan;Jiahui Yu;Haichao Yu;Thomas S. Huang;Ya Zhou;Xin Li;Sen Liu;Zhibo Chen;Saikat Dutta;Sourya Dipta Das;Shivam Garg;Daniel Sprague;Bhrij Patel;Thomas Huck

2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2020 | Conference Paper |

IEEE Personal Account

Change username/password

Purchase Details

Payment Options
View Purchased Documents

Profile Information

Communications Preferences
Profession and Education
Technical interests

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

Follow

About IEEE Xplore | Contact Us | Help | Accessibility | Terms of Use | Nondiscrimination Policy | IEEE Ethics Reporting | Sitemap | IEEE Privacy Policy

A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

© Copyright 2025 IEEE - All rights reserved, including rights for text and data mining and training of artificial intelligence and similar technologies.

IEEE Account

Change Username/Password
Update Address

Purchase Details

Payment Options
Order History
View Purchased Documents

Profile Information

Communications Preferences
Profession and Education
Technical Interests

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

About IEEE Xplore
Contact Us
Help
Accessibility
Terms of Use
Nondiscrimination Policy
Sitemap
Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.

Test Whats new message.